At a solid level, students will be able to interpret and understand the XPS, ToF-SIMS, and spectroscopic ellipsometry (SE) data in the literature.

Students will better understand how to use XPS, ToF-SIMS, and SE in their own research.

Students will improve their writing and research skills by writing a 10-page paper on a topic of their choice that is related to the material presented in the class.

Students will come to better understand the hardware that makes up high vacuum systems.

Students will become familiar with different methods for synthesizing/preparing thin films.